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Information card for entry 1513560
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Coordinates | 1513560.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | TIPSNDT3Q |
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Chemical name | TIPSNDT3Q |
Formula | C38 H46 N4 S2 Si2 |
Calculated formula | C38 H46 N4 S2 Si2 |
SMILES | s1c2c(cc1[Si](C(C)C)(C(C)C)C(C)C)C(C=C1C2=CC(c2c1sc([Si](C(C)C)(C(C)C)C(C)C)c2)=C(C#N)C#N)=C(C#N)C#N |
Title of publication | Dithiophene-Fused Tetracyanonaphthoquinodimethanes (DT-TNAPs): synthesis and characterization of π-extended quinoidal compounds for n-channel organic semiconductor. |
Authors of publication | Yanai, Naoyuki; Mori, Takamichi; Shinamura, Shoji; Osaka, Itaru; Takimiya, Kazuo |
Journal of publication | Organic letters |
Year of publication | 2014 |
Journal volume | 16 |
Journal issue | 1 |
Pages of publication | 240 - 243 |
a | 10.6749 ± 0.0013 Å |
b | 15.0601 ± 0.0014 Å |
c | 12.3997 ± 0.0014 Å |
α | 90 ± 0.0011° |
β | 108.478 ± 0.0013° |
γ | 90 ± 0.0011° |
Cell volume | 1890.7 ± 0.4 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0623 |
Residual factor for significantly intense reflections | 0.0482 |
Weighted residual factors for significantly intense reflections | 0.1319 |
Weighted residual factors for all reflections included in the refinement | 0.1438 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.936 |
Diffraction radiation wavelength | 0.7107 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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