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Information card for entry 1513614
Preview
Coordinates | 1513614.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C30 H45 N6 Na O Si3 U |
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Calculated formula | C30 H45 N6 Na O Si3 U |
SMILES | [U]12345([N]6(CC[N]1(CCN2CC6)[Si](N4c1ccccc1)(C)C)[Si](N3c1ccccc1)(C)C)O[Si](N5c1ccccc1)(C)C.[Na+] |
Title of publication | Two-electron versus one-electron reduction of chalcogens by uranium(iii): synthesis of a terminal U(v) persulfide complex |
Authors of publication | Camp, Clément; Antunes, Maria Augusta; García, Gregorio; Ciofini, Ilaria; Santos, Isabel C.; Pécaut, Jacques; Almeida, Manuel; Marçalo, Joaquim; Mazzanti, Marinella |
Journal of publication | Chemical Science |
Year of publication | 2014 |
Journal volume | 5 |
Journal issue | 2 |
Pages of publication | 841 |
a | 10.5247 ± 0.0003 Å |
b | 18.506 ± 0.0005 Å |
c | 17.3041 ± 0.0006 Å |
α | 90° |
β | 91.612 ± 0.003° |
γ | 90° |
Cell volume | 3368.99 ± 0.18 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0959 |
Residual factor for significantly intense reflections | 0.0496 |
Weighted residual factors for significantly intense reflections | 0.0799 |
Weighted residual factors for all reflections included in the refinement | 0.0925 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.016 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1513614.html
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