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Information card for entry 1513793
Preview
Coordinates | 1513793.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C66 H58 Cl3 O5 Os P3 |
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Calculated formula | C66 H58 Cl3 O5 Os P3 |
SMILES | [Os]12([P](c3ccccc3)(c3ccccc3)c3ccccc3)([P](c3ccccc3)(c3ccccc3)c3ccccc3)(C(=C([P+](c3ccccc3)(c3ccccc3)c3ccccc3)C=C1C=C(C=2)C(=O)OC)OC)C#[O].[Cl-].O.ClCCl |
Title of publication | Planar Möbius aromatic pentalenes incorporating 16 and 18 valence electron osmiums. |
Authors of publication | Zhu, Congqing; Luo, Ming; Zhu, Qin; Zhu, Jun; Schleyer, Paul V. R.; Wu, Judy I-Chia; Lu, Xin; Xia, Haiping |
Journal of publication | Nature communications |
Year of publication | 2014 |
Journal volume | 5 |
Pages of publication | 3265 |
a | 12.6439 ± 0.0002 Å |
b | 21.0196 ± 0.0004 Å |
c | 21.9093 ± 0.0004 Å |
α | 90° |
β | 96.0021 ± 0.0007° |
γ | 90° |
Cell volume | 5790.91 ± 0.18 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0401 |
Residual factor for significantly intense reflections | 0.0338 |
Weighted residual factors for significantly intense reflections | 0.0855 |
Weighted residual factors for all reflections included in the refinement | 0.0881 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.055 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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The link is: https://www.crystallography.net/1513793.html
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