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Information card for entry 1513797
Preview
Coordinates | 1513797.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C25 H33 F5 Si3 |
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Calculated formula | C25 H33 F5 Si3 |
SMILES | C1(=C([C@@]2([C@@]3([C@@H]4[C@H]1[C@H]2C=C[C@H]34)[Si](C)(C)C)[Si](C)(C)C)c1c(c(c(c(c1F)F)F)F)F)[Si](C)(C)C.C1(=C([C@]2([C@]3([C@H]4[C@@H]1[C@@H]2C=C[C@@H]34)[Si](C)(C)C)[Si](C)(C)C)c1c(c(c(c(c1F)F)F)F)F)[Si](C)(C)C |
Title of publication | A Diels-Alder super diene breaking benzene into C2H2 and C4H4 units. |
Authors of publication | Inagaki, Yusuke; Nakamoto, Masaaki; Sekiguchi, Akira |
Journal of publication | Nature communications |
Year of publication | 2014 |
Journal volume | 5 |
Pages of publication | 3018 |
a | 9.6564 ± 0.0003 Å |
b | 11.3871 ± 0.0004 Å |
c | 12.9349 ± 0.0004 Å |
α | 72.1° |
β | 81.25° |
γ | 79.77° |
Cell volume | 1324.69 ± 0.07 Å3 |
Cell temperature | 120 K |
Ambient diffraction temperature | 120 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0331 |
Residual factor for significantly intense reflections | 0.0294 |
Weighted residual factors for significantly intense reflections | 0.0777 |
Weighted residual factors for all reflections included in the refinement | 0.0804 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.038 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1513797.html
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Users of the data should acknowledge the original authors of the
structural data.