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Information card for entry 1513908
Preview
Coordinates | 1513908.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C75.32 H68.31 Cl1.98 N8 Ni2 O0.31 |
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Calculated formula | C75.32 H68.31 Cl1.98 N8 Ni2 O0.312 |
SMILES | [Ni]123[n]4c5=C(c6n3c(C(=c3[n]2c(C(=c2n1c(=C(c4cc5)c1cc(cc(c1)C(C)(C)C)C(C)(C)C)cc2)c1ccccc1)cc3)c1cc(cc(c1)C(C)(C)C)C(C)(C)C)cc6)C1=c2n3[Ni]45[n]6c(C=c3cc2)ccc6=Cc2n4c(cc2)C=c2[n]5c1cc2.ClCCCl.O |
Title of publication | Silylethynyl substituents as porphyrin protecting groups for solubilization and selectivity control. |
Authors of publication | Oda, Kazuma; Akita, Masanari; Hiroto, Satoru; Shinokubo, Hiroshi |
Journal of publication | Organic letters |
Year of publication | 2014 |
Journal volume | 16 |
Journal issue | 6 |
Pages of publication | 1818 - 1821 |
a | 11.636 ± 0.002 Å |
b | 15.963 ± 0.003 Å |
c | 19.746 ± 0.004 Å |
α | 102.414 ± 0.002° |
β | 101.791 ± 0.002° |
γ | 108.945 ± 0.002° |
Cell volume | 3235.3 ± 1.1 Å3 |
Cell temperature | 113 ± 2 K |
Ambient diffraction temperature | 113 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0733 |
Residual factor for significantly intense reflections | 0.0547 |
Weighted residual factors for significantly intense reflections | 0.1527 |
Weighted residual factors for all reflections included in the refinement | 0.1756 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.13 |
Diffraction radiation wavelength | 0.71075 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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The link is: https://www.crystallography.net/1513908.html
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