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Information card for entry 1514571
Preview
| Coordinates | 1514571.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C44 H46 Ce O2 P3 Se6 |
|---|---|
| Calculated formula | C44 H46 Ce O2 P3 Se6 |
| SMILES | [Ce]123([Se]=P([Se]1)(c1ccccc1)c1ccccc1)([Se]=P([Se]2)(c1ccccc1)c1ccccc1)([Se]=P([Se]3)(c1ccccc1)c1ccccc1)([O]1CCCC1)[O]1CCCC1 |
| Title of publication | Uncovering f-element bonding differences and electronic structure in a series of 1 : 3 and 1 : 4 complexes with a diselenophosphinate ligand |
| Authors of publication | Jones, Matthew B.; Gaunt, Andrew J.; Gordon, John C.; Kaltsoyannis, Nikolas; Neu, Mary P.; Scott, Brian L. |
| Journal of publication | Chemical Science |
| Year of publication | 2013 |
| Journal volume | 4 |
| Journal issue | 3 |
| Pages of publication | 1189 |
| a | 9.8457 ± 0.0013 Å |
| b | 13.0684 ± 0.0017 Å |
| c | 19.024 ± 0.002 Å |
| α | 88.6 ± 0.001° |
| β | 85.615 ± 0.001° |
| γ | 70.493 ± 0.001° |
| Cell volume | 2300.5 ± 0.5 Å3 |
| Cell temperature | 120 ± 1 K |
| Ambient diffraction temperature | 120 ± 1 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0474 |
| Residual factor for significantly intense reflections | 0.0323 |
| Weighted residual factors for significantly intense reflections | 0.0685 |
| Weighted residual factors for all reflections included in the refinement | 0.0739 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.986 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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