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Information card for entry 1514574
Preview
| Coordinates | 1514574.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C44 H46 N0 O2 P3 Pu Se6 |
|---|---|
| Calculated formula | C44 H46 O2 P3 Pu Se6 |
| SMILES | [Pu]123([Se]=P([Se]1)(c1ccccc1)c1ccccc1)([Se]=P([Se]2)(c1ccccc1)c1ccccc1)([Se]=P([Se]3)(c1ccccc1)c1ccccc1)([O]1CCCC1)[O]1CCCC1 |
| Title of publication | Uncovering f-element bonding differences and electronic structure in a series of 1 : 3 and 1 : 4 complexes with a diselenophosphinate ligand |
| Authors of publication | Jones, Matthew B.; Gaunt, Andrew J.; Gordon, John C.; Kaltsoyannis, Nikolas; Neu, Mary P.; Scott, Brian L. |
| Journal of publication | Chemical Science |
| Year of publication | 2013 |
| Journal volume | 4 |
| Journal issue | 3 |
| Pages of publication | 1189 |
| a | 13.344 ± 0.004 Å |
| b | 18.862 ± 0.005 Å |
| c | 20.428 ± 0.005 Å |
| α | 79.465 ± 0.004° |
| β | 89.356 ± 0.004° |
| γ | 70.12 ± 0.003° |
| Cell volume | 4746 ± 2 Å3 |
| Cell temperature | 141 ± 2 K |
| Ambient diffraction temperature | 141 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1355 |
| Residual factor for significantly intense reflections | 0.0703 |
| Weighted residual factors for significantly intense reflections | 0.1556 |
| Weighted residual factors for all reflections included in the refinement | 0.1816 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.947 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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