Information card for entry 1514783
| Formula |
C17 H20 N4 Ni |
| Calculated formula |
C17 H20 N4 Ni |
| SMILES |
[Ni]123[n]4ccccc4C=[N]1CC(C[N]2=Cc1[n]3cccc1)(C)C |
| Title of publication |
Exploring the limits of redox non-innocence: pseudo square planar [{κ4-Me2C(CH2NCHpy)2}Ni]n (n = 2+, 1+, 0, −1, −2) favor Ni(ii) |
| Authors of publication |
Williams, Valerie A.; Hulley, Elliott B.; Wolczanski, Peter T.; Lancaster, Kyle M.; Lobkovsky, Emil B. |
| Journal of publication |
Chemical Science |
| Year of publication |
2013 |
| Journal volume |
4 |
| Journal issue |
9 |
| Pages of publication |
3636 |
| a |
14.9461 ± 0.0004 Å |
| b |
7.3243 ± 0.0002 Å |
| c |
15.6793 ± 0.0004 Å |
| α |
90° |
| β |
112.463 ± 0.002° |
| γ |
90° |
| Cell volume |
1586.18 ± 0.08 Å3 |
| Cell temperature |
173 ± 2 K |
| Ambient diffraction temperature |
173 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0422 |
| Residual factor for significantly intense reflections |
0.032 |
| Weighted residual factors for significantly intense reflections |
0.0876 |
| Weighted residual factors for all reflections included in the refinement |
0.0939 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.044 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/1514783.html