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Information card for entry 1514824
Preview
Coordinates | 1514824.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | [Ni(TMFdoen)Zn(Me3TACN)(THF)]BPh4 |
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Formula | C61 H89 B N7 Ni O6.5 Zn |
Calculated formula | C61 H89 B N7 Ni O6.5 Zn |
SMILES | [Zn]123(O[N]4[Ni]56[N](=C7C=4C(OC7(C)C)(C)C)CC[N]6=C4C(=[N]5O3)C(OC4(C)C)(C)C)([N]3(CC[N]2(C)CC[N]1(C)CC3)C)[O]1CCCC1.c1(ccccc1)[B-](c1ccccc1)(c1ccccc1)c1ccccc1.O1CCCC1.O1CCCC1 |
Title of publication | Access to formally Ni(i) states in a heterobimetallic NiZn system |
Authors of publication | Uyeda, Christopher; Peters, Jonas C. |
Journal of publication | Chemical Science |
Year of publication | 2013 |
Journal volume | 4 |
Journal issue | 1 |
Pages of publication | 157 |
a | 11.9784 ± 0.0008 Å |
b | 19.7901 ± 0.0014 Å |
c | 26.294 ± 0.0018 Å |
α | 104.912 ± 0.004° |
β | 91.396 ± 0.004° |
γ | 98.3 ± 0.004° |
Cell volume | 5947.7 ± 0.7 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1235 |
Residual factor for significantly intense reflections | 0.0552 |
Weighted residual factors for significantly intense reflections | 0.1179 |
Weighted residual factors for all reflections included in the refinement | 0.1432 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.013 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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Users of the data should acknowledge the original authors of the
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