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Information card for entry 1515061
Preview
Coordinates | 1515061.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C15 H20 N2 O4 S |
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Calculated formula | C15 H20 N2 O4 S |
SMILES | C1C(C[C@H]2[C@H](c3ccccc3)N(C(=O)OC)S(=O)(=O)N12)(C)C.C1C(C[C@@H]2[C@@H](c3ccccc3)N(C(=O)OC)S(=O)(=O)N12)(C)C |
Title of publication | Metal-free diamination of alkenes employing bromide catalysis |
Authors of publication | Chávez, Patricia; Kirsch, Jonathan; Hövelmann, Claas H.; Streuff, Jan; Martínez-Belmonte, Marta; Escudero-Adán, Eduardo C.; Martin, Eddy; Muñiz, Kilian |
Journal of publication | Chemical Science |
Year of publication | 2012 |
Journal volume | 3 |
Journal issue | 7 |
Pages of publication | 2375 |
a | 5.8032 ± 0.0008 Å |
b | 20.518 ± 0.003 Å |
c | 12.8411 ± 0.0017 Å |
α | 90° |
β | 97.101 ± 0.004° |
γ | 90° |
Cell volume | 1517.3 ± 0.4 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0435 |
Residual factor for significantly intense reflections | 0.0349 |
Weighted residual factors for significantly intense reflections | 0.0869 |
Weighted residual factors for all reflections included in the refinement | 0.0908 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.072 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1515061.html
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