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Information card for entry 1515122
Preview
Coordinates | 1515122.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C22 H22 O4 |
---|---|
Calculated formula | C22 H22 O4 |
SMILES | c1ccccc1CC1(C(=O)OC(C)(C)OC1=O)Cc1ccc(cc1)C=C |
Title of publication | Low-temperature ketene formation in materials chemistry through molecular engineering |
Authors of publication | Leibfarth, Frank A.; Wolffs, Martin; Campos, Luis M.; Delany, Kris; Treat, Nicolas; Kade, Matthew J.; Moon, Bongjin; Hawker, Craig J. |
Journal of publication | Chemical Science |
Year of publication | 2012 |
Journal volume | 3 |
Journal issue | 3 |
Pages of publication | 766 |
a | 9.534 ± 0.002 Å |
b | 19.6 ± 0.005 Å |
c | 10.977 ± 0.003 Å |
α | 90° |
β | 110.365 ± 0.003° |
γ | 90° |
Cell volume | 1923 ± 0.8 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 3 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.2384 |
Residual factor for significantly intense reflections | 0.0512 |
Weighted residual factors for significantly intense reflections | 0.1108 |
Weighted residual factors for all reflections included in the refinement | 0.1584 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.797 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1515122.html
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Users of the data should acknowledge the original authors of the
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