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Information card for entry 1515232
Preview
| Coordinates | 1515232.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C23.5 H27 Cl F6 N2 Rh Sb |
|---|---|
| Calculated formula | C23.5 H27 Cl F6 N2 Rh Sb |
| SMILES | [Rh]12345([n]6c(c7c1cccc7)cccc6)([N]#CC)[c]1([c]2([c]3([c]4([c]51C)C)C)C)C.[Sb](F)(F)(F)(F)(F)[F-].ClCCl |
| Title of publication | Mechanistic understanding of Rh-catalyzed N-sulfonylaldimine insertion into aryl C‒H bonds |
| Authors of publication | Li, Yang; Zhang, Xi-Sha; Li, Hu; Wang, Wen-Hua; Chen, Kang; Li, Bi-Jie; Shi, Zhang-Jie |
| Journal of publication | Chemical Science |
| Year of publication | 2012 |
| Journal volume | 3 |
| Journal issue | 5 |
| Pages of publication | 1634 |
| a | 24.2 ± 0.003 Å |
| b | 13.427 ± 0.0016 Å |
| c | 16.2572 ± 0.0019 Å |
| α | 90° |
| β | 95.747 ± 0.002° |
| γ | 90° |
| Cell volume | 5256 ± 1.1 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0684 |
| Residual factor for significantly intense reflections | 0.0636 |
| Weighted residual factors for significantly intense reflections | 0.1524 |
| Weighted residual factors for all reflections included in the refinement | 0.1565 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.092 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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