Information card for entry 1515427
| Formula |
C57 H65 F3 Si2 |
| Calculated formula |
C57 H65 F3 Si2 |
| SMILES |
[Si](C#Cc1c2cc3cc(ccc3cc2c(c2cc3ccccc3cc12)C#C[Si](C1CCCC1)(C1CCCC1)C1CCCC1)C(F)(F)F)(C1CCCC1)(C1CCCC1)C1CCCC1 |
| Title of publication |
A survey of electron-deficient pentacenes as acceptors in polymer bulk heterojunction solar cells |
| Authors of publication |
Shu, Ying; Lim, Yee-Fun; Li, Zhong; Purushothaman, Balaji; Hallani, Rawad; Kim, Jo Eun; Parkin, Sean R.; Malliaras, George G.; Anthony, John E. |
| Journal of publication |
Chemical Science |
| Year of publication |
2011 |
| Journal volume |
2 |
| Journal issue |
2 |
| Pages of publication |
363 |
| a |
14.7922 ± 0.0003 Å |
| b |
17.7744 ± 0.0004 Å |
| c |
18.0925 ± 0.0004 Å |
| α |
90° |
| β |
98.265 ± 0.001° |
| γ |
90° |
| Cell volume |
4707.52 ± 0.18 Å3 |
| Cell temperature |
90 ± 0.2 K |
| Ambient diffraction temperature |
90 ± 0.2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.1048 |
| Residual factor for significantly intense reflections |
0.0812 |
| Weighted residual factors for significantly intense reflections |
0.2001 |
| Weighted residual factors for all reflections included in the refinement |
0.225 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.06 |
| Diffraction radiation wavelength |
1.54178 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
Yes |
| Has Fobs |
No |
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