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Information card for entry 1515616
Preview
Coordinates | 1515616.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | H90 Na28 O163 Te10 W28 |
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Calculated formula | Na16.4 O153 Te9.5 W28 |
SMILES | [O]12[W]34(=O)(=O)[O][W]567(=O)[O]89[W]%10%11(O7)(=O)O[W]7(=O)(=O)(O[W]2(O5)(=O)(=O)O4)O[W]([O]7[Te]18O[Te](O)O)(O%11)(=O)(=O)O[Te]12O[W]9(O6)(O%10)(=O)O[Te]4(O3)O[W]356(=O)[O]78[W]9%10(O3)(=O)O[W]8(O4)(=O)(=O)[O]3[Te]7[O]4[W]7(=O)(=O)(O[W]8(O5)(O9)(=O)O[W]4(=O)(O7)(=O)O[W]3(O8)(=O)(O%10)=O)O[Te]3(O6)O[W]45(=O)(=O)O[W]678(=O)[O]9%10[W]%11(O6)(=O)(O3)O[Te]3(O[W]%12%13(=O)(=O)[O]%14[Te]9[O]4[W](O7)(O5)(=O)(=O)O[W]%14(O%12)(=O)(=O)O[W]%10(O%11)(O%13)(O8)=O)O[W]45(=O)(O2)[O]26[W]78(=O)(O4)O[W]49(O5)(=O)O[W]25(=O)(=O)O[W]2(O7)(=O)(=O)O[W](O1)(O8)(=O)(=O)[O]2[Te]6([O]4[W](=O)(O9)(O3)(O5)=O)O[Te](O)O.[Na+].O.[Na+].[Na+].[Na+].O.O.O.O.[Na+].[Na+].O.O.[Na+].O.[Na+].O.[Na+].O.[Na+].[Na+].O.O.O.O.[Na+].O.[Na+].O.O.O.O.[Na+].O.[Na+].O.O.O.O.O.O.O.O.O.[Na+].[Na+].[Na+].O.O.[Na+].O.O.[Na+].O.[Na+].O.[Na+].O.[Na+].[Na+].O.O.O.[Na+].O.[Na+].O.[Na+].O.O.O.O.O.O.O.O.O.[Na+].[Na+] |
Title of publication | Self-assembly of a family of macrocyclic polyoxotungstates with emergent material properties |
Authors of publication | Gao, Jing; Yan, Jun; Mitchell, Scott G.; Miras, Haralampos N.; Boulay, Antoine G.; Long, De-Liang; Cronin, Leroy |
Journal of publication | Chemical Science |
Year of publication | 2011 |
Journal volume | 2 |
Journal issue | 8 |
Pages of publication | 1502 |
a | 34.873 ± 0.0001 Å |
b | 18.6557 ± 0.0003 Å |
c | 27.5438 ± 0.0008 Å |
α | 90° |
β | 105.384 ± 0.004° |
γ | 90° |
Cell volume | 17277.4 ± 0.7 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 5 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0781 |
Residual factor for significantly intense reflections | 0.0485 |
Weighted residual factors for significantly intense reflections | 0.1205 |
Weighted residual factors for all reflections included in the refinement | 0.1273 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.944 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1515616.html
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Users of the data should acknowledge the original authors of the
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