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Information card for entry 1515642
Preview
Coordinates | 1515642.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | xwf9a |
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Formula | C38 H72 Cl4 Fe N6 O4 Re |
Calculated formula | C38 H72 Cl4 Fe N6 O4 Re |
SMILES | C(N(CCCC)CCCC)=[O][Fe]([N]#C[Re](Cl)(Cl)(Cl)Cl)([O]=CN(CCCC)CCCC)([N]#C[Re](C#[N][Fe]([O]=CN(CCCC)CCCC)([O]=CN(CCCC)CCCC)([N]#[C])([O]=CN(CCCC)CCCC)[O]=CN(CCCC)CCCC)(Cl)(Cl)(Cl)Cl)([O]=CN(CCCC)CCCC)[O]=CN(CCCC)CCCC |
Title of publication | Influence of structure on exchange strength and relaxation barrier in a series of FeIIReIV(CN)2 single-chain magnets |
Authors of publication | Feng, Xiaowen; David Harris, T.; Long, Jeffrey R. |
Journal of publication | Chemical Science |
Year of publication | 2011 |
Journal volume | 2 |
Journal issue | 9 |
Pages of publication | 1688 |
a | 8.9348 ± 0.0006 Å |
b | 10.504 ± 0.0007 Å |
c | 14.0627 ± 0.001 Å |
α | 68.984 ± 0.004° |
β | 77.296 ± 0.004° |
γ | 85.408 ± 0.004° |
Cell volume | 1201.85 ± 0.15 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0566 |
Residual factor for significantly intense reflections | 0.054 |
Weighted residual factors for significantly intense reflections | 0.1395 |
Weighted residual factors for all reflections included in the refinement | 0.1417 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.06 |
Diffraction radiation wavelength | 1.54178 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1515642.html
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Users of the data should acknowledge the original authors of the
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