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Information card for entry 1515798
Preview
Coordinates | 1515798.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C80 H106 Si2 Sn2 |
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Calculated formula | C80 H106 Si2 Sn2 |
SMILES | [Sn]([Sn]c1c(cc([Si](C)(C)C)cc1c1c(cccc1C(C)C)C(C)C)c1c(cccc1C(C)C)C(C)C)c1c(cc([Si](C)(C)C)cc1c1c(cccc1C(C)C)C(C)C)c1c(cccc1C(C)C)C(C)C.c1(ccccc1)C.c1(ccccc1)C |
Title of publication | Substituent effects in ditetrel alkyne analogues: multiple vs. single bonded isomers |
Authors of publication | Peng, Yang; Fischer, Roland C.; Merrill, W. Alexander; Fischer, Jelena; Pu, Lihung; Ellis, Bobby D.; Fettinger, James C.; Herber, Rolfe H.; Power, Philip P. |
Journal of publication | Chemical Science |
Year of publication | 2010 |
Journal volume | 1 |
Journal issue | 4 |
Pages of publication | 461 |
a | 12.7007 ± 0.0004 Å |
b | 11.7079 ± 0.0004 Å |
c | 24.3198 ± 0.0008 Å |
α | 90° |
β | 90.138 ± 0.001° |
γ | 90° |
Cell volume | 3616.3 ± 0.2 Å3 |
Cell temperature | 90 ± 2 K |
Ambient diffraction temperature | 90 ± 2 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0287 |
Residual factor for significantly intense reflections | 0.024 |
Weighted residual factors for significantly intense reflections | 0.0638 |
Weighted residual factors for all reflections included in the refinement | 0.066 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.047 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1515798.html
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