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Information card for entry 1515864
Preview
Coordinates | 1515864.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C36 H32 F24 N4 P4 |
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Calculated formula | C36 H32 F24 N4 P4 |
SMILES | [P](F)(F)(F)(F)(F)[F-].[P](F)(F)(F)(F)(F)[F-].[P](F)(F)(F)(F)(F)[F-].[P](F)(F)(F)(F)(F)[F-].[n+]12ccc(c3cc[n+](Cc4ccc(C[n+]5ccc(c6cc[n+](Cc7ccc(C2)cc7)cc6)cc5)cc4)cc3)cc1 |
Title of publication | Enabling tetracationic cyclophane production by trading templates |
Authors of publication | Sue, Chi-Hau; Basu, Subhadeep; Fahrenbach, Albert C.; Shveyd, Alexander K.; Dey, Sanjeev K.; Botros, Youssry Y.; Stoddart, J. Fraser |
Journal of publication | Chemical Science |
Year of publication | 2010 |
Journal volume | 1 |
Journal issue | 1 |
Pages of publication | 119 |
a | 7.3165 ± 0.001 Å |
b | 13.7561 ± 0.0011 Å |
c | 20.634 ± 0.002 Å |
α | 90° |
β | 97.195 ± 0.008° |
γ | 90° |
Cell volume | 2060.4 ± 0.4 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.1104 |
Residual factor for significantly intense reflections | 0.068 |
Weighted residual factors for significantly intense reflections | 0.1683 |
Weighted residual factors for all reflections included in the refinement | 0.1972 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.982 |
Diffraction radiation wavelength | 1.54178 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1515864.html
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Users of the data should acknowledge the original authors of the
structural data.