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Information card for entry 1516588
Preview
Coordinates | 1516588.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C47 H73 N Si Th |
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Calculated formula | C47 H73 N Si Th |
SMILES | [c]12([c]3([cH]4[c]5([cH]1[ThH]16782345([c]2([c]1([cH]6[c]7([cH]82)C(C)(C)C)C(C)(C)C)C(C)(C)C)N(c1ccc(cc1)C)[SiH2]c1ccccc1)C(C)(C)C)C(C)(C)C)C(C)(C)C |
Title of publication | Si‒H addition followed by C‒H bond activation induced by a terminal thorium imido metallocene: a combined experimental and computational study |
Authors of publication | Ren, Wenshan; Zhou, Enwei; Fang, Bo; Zi, Guofu; Fang, De-Cai; Walter, Marc D. |
Journal of publication | Chemical Science |
Year of publication | 2014 |
Journal volume | 5 |
Journal issue | 8 |
Pages of publication | 3165 |
a | 10.4251 ± 0.0006 Å |
b | 20.765 ± 0.0012 Å |
c | 44.289 ± 0.003 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 9587.6 ± 1 Å3 |
Cell temperature | 110 ± 2 K |
Ambient diffraction temperature | 110 ± 2 K |
Number of distinct elements | 5 |
Space group number | 61 |
Hermann-Mauguin space group symbol | P b c a |
Hall space group symbol | -P 2ac 2ab |
Residual factor for all reflections | 0.0457 |
Residual factor for significantly intense reflections | 0.0324 |
Weighted residual factors for significantly intense reflections | 0.0636 |
Weighted residual factors for all reflections included in the refinement | 0.0664 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.097 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1516588.html
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Users of the data should acknowledge the original authors of the
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