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Information card for entry 1516590
Preview
Coordinates | 1516590.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C54 H87 N3 Th |
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Calculated formula | C54 H87 N3 Th |
SMILES | [c]12([c]3([cH]4[c]5([cH]1[Th]167892345([c]2([c]1([cH]6[c]7([cH]82)C(C)(C)C)C(C)(C)C)C(C)(C)C)N(c1ccc(C)cc1)C(=NC1CCCCC1)N9C1CCCCC1)C(C)(C)C)C(C)(C)C)C(C)(C)C |
Title of publication | Si‒H addition followed by C‒H bond activation induced by a terminal thorium imido metallocene: a combined experimental and computational study |
Authors of publication | Ren, Wenshan; Zhou, Enwei; Fang, Bo; Zi, Guofu; Fang, De-Cai; Walter, Marc D. |
Journal of publication | Chemical Science |
Year of publication | 2014 |
Journal volume | 5 |
Journal issue | 8 |
Pages of publication | 3165 |
a | 10.436 ± 0.002 Å |
b | 15.509 ± 0.003 Å |
c | 20.314 ± 0.004 Å |
α | 92.787 ± 0.003° |
β | 92.25 ± 0.003° |
γ | 109.072 ± 0.003° |
Cell volume | 3098.4 ± 1 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0851 |
Residual factor for significantly intense reflections | 0.0776 |
Weighted residual factors for significantly intense reflections | 0.2236 |
Weighted residual factors for all reflections included in the refinement | 0.2304 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.118 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1516590.html
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Users of the data should acknowledge the original authors of the
structural data.