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Information card for entry 1517285
Preview
Coordinates | 1517285.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | 4-methoxy-2-(1-(naphthalen-2-ylsulfonyl)ethyl)phenol |
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Formula | C19 H18 O4 S |
Calculated formula | C19 H18 O4 S |
SMILES | c1(ccc(c(c1)[C@H](C)S(=O)(=O)c1ccc2c(c1)cccc2)O)OC |
Title of publication | Formal asymmetric hydrobromination of styrenes via copper-catalyzed 1,3-halogen migration |
Authors of publication | Van Hoveln, R. J.; Schmid, S. C.; Tretbar, M.; Buttke, C. T.; Schomaker, J. M. |
Journal of publication | Chem. Sci. |
Year of publication | 2014 |
Journal volume | 5 |
Journal issue | 12 |
Pages of publication | 4763 |
a | 5.5066 ± 0.0001 Å |
b | 14.1867 ± 0.0002 Å |
c | 20.951 ± 0.0004 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 1636.7 ± 0.05 Å3 |
Cell temperature | 193 ± 2 K |
Ambient diffraction temperature | 193 ± 2 K |
Number of distinct elements | 4 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.0282 |
Residual factor for significantly intense reflections | 0.0279 |
Weighted residual factors for significantly intense reflections | 0.0755 |
Weighted residual factors for all reflections included in the refinement | 0.0757 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.08 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Diffraction radiation X-ray symbol | K-L~3~ |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1517285.html
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