Information card for entry 1517991

Structure parameters

• Formula: Na8 Si4 Te10
• Calculated formula: Na8 Si4 Te10
• SMILES: [Na+].[Na+].[Na+].[Te-][Si]1([Te-])[Si]([Te-])([Te-])[Te][Si]([Si]([Te-])([Te-])[Te-])([Te-])[Te]1.[Na+].[Na+].[Na+].[Na+].[Na+]
• Title of publication: Neuartige Si4Te10(8-) und Ge4Te10(8-) anionen im Na8Si4Te10 bzw. Na8Ge4Te10
• Authors of publication: Eisenmann, Brigitte; Schwerer, Heike; Schafer, Herbert
• Journal of publication: Revue de Chimie Minerale'
• Year of publication: 1983
• Journal volume: 20
• Pages of publication: 78 - 87
• a: 14.073 ± 0.012 Å
• b: 12.842 ± 0.012 Å
• c: 14.882 ± 0.012 Å
• α: 90°
• β: 92.22 ± 0.1°
• γ: 90°
• Cell volume: 2688 ± 4 ų
• Ambient diffraction temperature: 293 K
• Number of distinct elements: 3
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Weighted residual factors for significantly intense reflections: 0.104
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71069 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No