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Information card for entry 1517995
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Coordinates | 1517995.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | Perylene2- TCNQ |
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Chemical name | TCNQ (perylene)1-perylene |
Formula | C52 H28 N4 |
Calculated formula | C52 H28 N4 |
SMILES | N#CC(=C1C=CC(C=C1)=C(C#N)C#N)C#N.c1cc2c3c(c1)c1c4c(ccc1)cccc4c3ccc2.c12cccc3c1c(c1cccc4cccc2c14)ccc3 |
Title of publication | Charge Transport Properties of Perylene‒TCNQ Crystals: The Effect of Stoichiometry |
Authors of publication | Vermeulen, D.; Zhu, L. Y.; Goetz, K. P.; Hu, Peng; Jiang, Hui; Day, C. S.; Jurchescu, O. D.; Coropceanu, V.; Kloc, C.; McNeil, L. E. |
Journal of publication | The Journal of Physical Chemistry C |
Year of publication | 2014 |
Journal volume | 118 |
Journal issue | 42 |
Pages of publication | 24688 |
a | 7.1812 Å |
b | 11.08 ± 0.005 Å |
c | 11.904 ± 0.004 Å |
α | 103.81 ± 0.04° |
β | 102.91 ± 0.03° |
γ | 101.32 ± 0.01° |
Cell volume | 864.8 ± 0.5 Å3 |
Cell temperature | 293 K |
Ambient diffraction temperature | 293 K |
Number of distinct elements | 3 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0776 |
Residual factor for significantly intense reflections | 0.0412 |
Weighted residual factors for significantly intense reflections | 0.097 |
Weighted residual factors for all reflections included in the refinement | 0.1163 |
Goodness-of-fit parameter for significantly intense reflections | 2.21 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.98 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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