Information card for entry 1518237
| Common name |
TTPO |
| Chemical name |
5,6,7-trithiapentacene-13-one |
| Formula |
C22 H10 O S3 |
| Calculated formula |
C22 H10 O S3 |
| SMILES |
O=C1c2cc3ccccc3c3c2C2c4c(SS=2S3)c2ccccc2cc14 |
| Title of publication |
A Robust, High-Temperature Organic Semiconductor |
| Authors of publication |
Kintigh, Jeremy T.; Hodgson, Jennifer L.; Singh, Anup; Pramanik, Chandrani; Larson, Amanda M.; Zhou, Lei; Briggs, Jonathan B.; Noll, Bruce C.; Kheirkhahi, Erfan; Pohl, Karsten; McGruer, Nicol E.; Miller, Glen P. |
| Journal of publication |
The Journal of Physical Chemistry C |
| Year of publication |
2014 |
| Journal volume |
118 |
| Journal issue |
46 |
| Pages of publication |
26955 |
| a |
9.0844 ± 0.0006 Å |
| b |
7.373 ± 0.0005 Å |
| c |
23.5319 ± 0.0015 Å |
| α |
90° |
| β |
90.457 ± 0.004° |
| γ |
90° |
| Cell volume |
1576.1 ± 0.18 Å3 |
| Cell temperature |
100 ± 2 K |
| Ambient diffraction temperature |
100 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0629 |
| Residual factor for significantly intense reflections |
0.0459 |
| Weighted residual factors for significantly intense reflections |
0.1221 |
| Weighted residual factors for all reflections included in the refinement |
0.1326 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.033 |
| Diffraction radiation wavelength |
1.54178 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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The link is:
https://www.crystallography.net/1518237.html