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Information card for entry 1518528
Preview
Coordinates | 1518528.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C30 H40 N2 O4 Si4 |
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Calculated formula | C30 H40 N2 O4 Si4 |
SMILES | COC(=O)C(=C\c1ccc(cc1)[Si](C)(C)[Si](C)(C)[Si](C)(C)[Si](C)(C)c1ccc(cc1)/C=C(C#N)/C(=O)OC)\C#N |
Title of publication | Increased carrier mobility in end-functionalized oligosilanes |
Authors of publication | Surampudi, S.; Yeh, M.-L.; Siegler, M. A.; Hardigree, J. F. Martinez; Kasl, T. A.; Katz, H. E.; Klausen, R. S. |
Journal of publication | Chem. Sci. |
Year of publication | 2015 |
Journal volume | 6 |
Journal issue | 3 |
Pages of publication | 1905 |
a | 8.5558 ± 0.0005 Å |
b | 11.887 ± 0.0004 Å |
c | 17.0071 ± 0.0008 Å |
α | 99.115 ± 0.003° |
β | 92.129 ± 0.004° |
γ | 94.397 ± 0.004° |
Cell volume | 1700.67 ± 0.14 Å3 |
Cell temperature | 110 ± 2 K |
Ambient diffraction temperature | 110 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0889 |
Residual factor for significantly intense reflections | 0.0629 |
Weighted residual factors for significantly intense reflections | 0.1706 |
Weighted residual factors for all reflections included in the refinement | 0.1941 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.026 |
Diffraction radiation wavelength | 1.54178 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1518528.html
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Users of the data should acknowledge the original authors of the
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