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Information card for entry 1518944
Preview
| Coordinates | 1518944.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C22 H34 Cl2 O4 Zr |
|---|---|
| Calculated formula | C22 H34 Cl2 O4 Zr |
| SMILES | [Zr]12345678(Cl)(Cl)([cH]9[cH]1[cH]3[cH]5[c]79C(C)(C)C(OC)OC)[cH]1[cH]2[cH]4[cH]6[c]81C(C)(C)C(OC)OC |
| Title of publication | Ether-Substituted Group 4 Metallocene Complexes: Cytostatic Effects and Applications in Ethylene Polymerization |
| Authors of publication | Ceballos-Torres, Jesús; Prashar, Sanjiv; Fajardo, Mariano; Chicca, Andrea; Gertsch, Jürg; Pinar, Ana B.; Gómez-Ruiz, Santiago |
| Journal of publication | Organometallics |
| Year of publication | 2015 |
| Journal volume | 34 |
| Journal issue | 11 |
| Pages of publication | 2522 |
| a | 25.577 ± 0.005 Å |
| b | 6.6615 ± 0.0013 Å |
| c | 14.001 ± 0.003 Å |
| α | 90° |
| β | 94.62 ± 0.004° |
| γ | 90° |
| Cell volume | 2377.8 ± 0.8 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0683 |
| Residual factor for significantly intense reflections | 0.0531 |
| Weighted residual factors for significantly intense reflections | 0.1307 |
| Weighted residual factors for all reflections included in the refinement | 0.1409 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.052 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1518944.html
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Users of the data should acknowledge the original authors of the
structural data.