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Information card for entry 1519136
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| Coordinates | 1519136.cif |
|---|
| Formula | C39 H38 B F15 Hf Si2 |
|---|---|
| Calculated formula | C39 H38 B F15 Hf Si2 |
| SMILES | [Hf]123456789([c]%10([cH]1[cH]2[c]3([Si](C)(C)C)[cH]4%10)[Si](C)(C)C)([cH]1[cH]5[cH]6[cH]7[c]9([cH]81)C)(C)C.Fc1c([B](C)(c2c(F)c(F)c(F)c(F)c2F)c2c(F)c(F)c(F)c(F)c2F)c(F)c(F)c(F)c1F |
| Title of publication | C13H27HfSi2, C19H3BF15, C7H8 |
| Authors of publication | Bochmann, Manfred; Coles, Simon J.; Hursthouse, Michael B. |
| Journal of publication | Crystal Structure Report Archive |
| Year of publication | 1994 |
| Pages of publication | 1200 |
| a | 11.289 ± 0.007 Å |
| b | 12.891 ± 0.008 Å |
| c | 14.531 ± 0.008 Å |
| α | 95.06 ± 0.04° |
| β | 95.64 ± 0.05° |
| γ | 105.5 ± 0.03° |
| Cell volume | 2013 ± 2 Å3 |
| Cell temperature | 120 ± 2 K |
| Ambient diffraction temperature | 120 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0451 |
| Residual factor for significantly intense reflections | 0.0396 |
| Weighted residual factors for significantly intense reflections | 0.0958 |
| Weighted residual factors for all reflections included in the refinement | 0.0971 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.023 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1519136.html
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Users of the data should acknowledge the original authors of the
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