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Information card for entry 1519140
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| Coordinates | 1519140.cif |
|---|---|
| External links | PubChem |
| Formula | C22 H50 N2 P2 Se2 Zn |
|---|---|
| Calculated formula | C22 H50 N2 P2 Se2 Zn |
| SMILES | [Zn]12([Se]P(=[N]1C(C)C)(C(C)(C)C)C(C)(C)C)[Se]P(=[N]2C(C)C)(C(C)(C)C)C(C)(C)C |
| Title of publication | C22H50N2P2Se2Zn |
| Authors of publication | Bochmann, Manfred; Coles, Simon J.; Hursthouse, Michael B. |
| Journal of publication | Crystal Structure Report Archive |
| Year of publication | 1994 |
| Pages of publication | 1195 |
| a | 15.815 ± 0.005 Å |
| b | 11.848 ± 0.008 Å |
| c | 16.041 ± 0.005 Å |
| α | 90° |
| β | 90.565 ± 0.018° |
| γ | 90° |
| Cell volume | 3006 ± 2 Å3 |
| Cell temperature | 220 ± 2 K |
| Ambient diffraction temperature | 220 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/a 1 |
| Hall space group symbol | -P 2yab |
| Residual factor for all reflections | 0.052 |
| Residual factor for significantly intense reflections | 0.0407 |
| Weighted residual factors for significantly intense reflections | 0.0955 |
| Weighted residual factors for all reflections included in the refinement | 0.0972 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.964 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1519140.html
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