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Information card for entry 1519299
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Coordinates | 1519299.cif |
---|
Formula | C32 H72 O12 Si8 |
---|---|
Calculated formula | C32 H72 O12 Si8 |
SMILES | [Si]12(O[Si]3(O[Si]4(O[Si](O1)(O[Si]1(O[Si](O[Si](O[Si](O2)(O1)CC(C)C)(O3)CC(C)C)(O4)CC(C)C)CC(C)C)CC(C)C)CC(C)C)CC(C)C)CC(C)C |
Title of publication | C32H72O12Si8 |
Authors of publication | Taylor, Peter. G.; Gelbrich, Thomas; Hursthouse, Michael B. |
Journal of publication | Crystal Structure Report Archive |
Year of publication | 2001 |
Pages of publication | 839 |
a | 10.0025 ± 0.0003 Å |
b | 10.8274 ± 0.0004 Å |
c | 10.9642 ± 0.0004 Å |
α | 96.668 ± 0.002° |
β | 91.162 ± 0.002° |
γ | 99.392 ± 0.001° |
Cell volume | 1162.66 ± 0.07 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.056 |
Residual factor for significantly intense reflections | 0.0382 |
Weighted residual factors for significantly intense reflections | 0.093 |
Weighted residual factors for all reflections included in the refinement | 0.0991 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.994 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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