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Information card for entry 1519395
Preview
| Coordinates | 1519395.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C37 H69 N3 S Si6 Th |
|---|---|
| Calculated formula | C37 H69 N3 S Si6 Th |
| SMILES | [Th](SC(c1ccccc1)(c1ccccc1)c1ccccc1)(N([Si](C)(C)C)[Si](C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)N([Si](C)(C)C)[Si](C)(C)C |
| Title of publication | Thorium‒ligand multiple bonds via reductive deprotection of a trityl group |
| Authors of publication | Smiles, Danil E.; Wu, Guang; Kaltsoyannis, Nikolas; Hayton, Trevor W. |
| Journal of publication | Chem. Sci. |
| Year of publication | 2015 |
| Journal volume | 6 |
| Journal issue | 7 |
| Pages of publication | 3891 |
| a | 10.5938 ± 0.001 Å |
| b | 11.5867 ± 0.0011 Å |
| c | 19.595 ± 0.0019 Å |
| α | 96.883 ± 0.002° |
| β | 91.006 ± 0.002° |
| γ | 96.27 ± 0.002° |
| Cell volume | 2372.5 ± 0.4 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0518 |
| Residual factor for significantly intense reflections | 0.035 |
| Weighted residual factors for significantly intense reflections | 0.0702 |
| Weighted residual factors for all reflections included in the refinement | 0.075 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.957 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1519395.html
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