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Information card for entry 1519465
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| Coordinates | 1519465.cif |
|---|---|
| External links | PubChem |
| Formula | C32 H48 O8 Si8 |
|---|---|
| Calculated formula | C32 H48 O8 Si8 |
| SMILES | [Si]1(O[Si](O[Si](O[Si](O1)(O[SiH](C)C)c1ccccc1)(O[SiH](C)C)c1ccccc1)(O[SiH](C)C)c1ccccc1)(O[SiH](C)C)c1ccccc1 |
| Title of publication | C32H48O8Si8 |
| Authors of publication | Taylor, Peter G.; Horton, Peter N.; Hursthouse, Michael B. |
| Journal of publication | Crystal Structure Report Archive |
| Year of publication | 2002 |
| Pages of publication | 937 |
| a | 10.6038 ± 0.0012 Å |
| b | 11.3298 ± 0.0014 Å |
| c | 19.444 ± 0.003 Å |
| α | 86.132 ± 0.005° |
| β | 81.457 ± 0.005° |
| γ | 68.06 ± 0.012° |
| Cell volume | 2142.6 ± 0.5 Å3 |
| Cell temperature | 120 ± 2 K |
| Ambient diffraction temperature | 120 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1995 |
| Residual factor for significantly intense reflections | 0.0751 |
| Weighted residual factors for significantly intense reflections | 0.1505 |
| Weighted residual factors for all reflections included in the refinement | 0.1901 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1519465.html
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