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Information card for entry 1519540
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Coordinates | 1519540.cif |
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Formula | C49 H48 Cl6 N5 O0.5 P Ru |
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Calculated formula | C49 H48 Cl6 N5 O0.5 P Ru |
SMILES | [Ru]12(Cl)(Cl)([P](c3ccccc3)(c3ccccc3)c3ccccc3)[n]3c(N4C=2N(c2c(C)cc(C)cc2C)C=C4)cccc3N2C=1N(C=C2)c1c(C)cc(C)cc1C.ClCCl.ClCCl.O |
Title of publication | C49H48Cl6N5O0.50PRu |
Authors of publication | Danopoulos, Andreas A.; Coles, Simon J.; Hursthouse, Michael B. |
Journal of publication | Crystal Structure Report Archive |
Year of publication | 2003 |
Pages of publication | 887 |
a | 20.561 ± 0.004 Å |
b | 18.024 ± 0.003 Å |
c | 13.845 ± 0.003 Å |
α | 90° |
β | 102.444 ± 0.004° |
γ | 90° |
Cell volume | 5010.3 ± 1.7 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.1048 |
Residual factor for significantly intense reflections | 0.0806 |
Weighted residual factors for significantly intense reflections | 0.2084 |
Weighted residual factors for all reflections included in the refinement | 0.2379 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.027 |
Diffraction radiation wavelength | 0.6888 Å |
Diffraction radiation type | synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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