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Information card for entry 1519714
Preview
Coordinates | 1519714.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C56 H33 D6 N O5 |
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Calculated formula | C56 H33 D6 N O5 |
SMILES | O=C1[C@@]2([C@H]3C(=O)N(C(=O)[C@H]3[C@]1(c1c2c2ccccc2c2ccccc12)c1ccccc1)c1c(Oc2cc3c4ccccc4ccc3cc2)cccc1)c1ccccc1.O=C(C([2H])([2H])[2H])C([2H])([2H])[2H] |
Title of publication | How important are dispersion interactions to the strength of aromatic stacking interactions in solution? |
Authors of publication | Hwang, Jungwun; Dial, Brent E.; Li, Ping; Kozik, Michael E.; Smith, Mark D.; Shimizu, Ken D. |
Journal of publication | Chem. Sci. |
Year of publication | 2015 |
Journal volume | 6 |
Journal issue | 7 |
Pages of publication | 4358 |
a | 12.741 ± 0.0012 Å |
b | 16.6787 ± 0.0016 Å |
c | 20.596 ± 0.002 Å |
α | 102.918 ± 0.002° |
β | 90.565 ± 0.002° |
γ | 106.517 ± 0.002° |
Cell volume | 4077.3 ± 0.7 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1079 |
Residual factor for significantly intense reflections | 0.0504 |
Weighted residual factors for significantly intense reflections | 0.0824 |
Weighted residual factors for all reflections included in the refinement | 0.0971 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.867 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1519714.html
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Users of the data should acknowledge the original authors of the
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