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Information card for entry 1519736
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Coordinates | 1519736.cif |
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Formula | C44 H36 Cl4 N16 O16 Zn2 |
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Calculated formula | C44 H36 Cl4 N16 O16 Zn2 |
SMILES | [Zn]12345[n]6ccccc6c6[n]3c(ccc6)C(N)=[N]4[N]3[Zn]467([n]8ccccc8c8[n]4c(ccc8)C(N)=[N]6[N]1=C(N)c1[n]2c(ccc1)c1[n]5cccc1)[n]1c(C=3N)cccc1c1[n]7cccc1.Cl(=O)(=O)(=O)[O-].Cl(=O)(=O)(=O)[O-].Cl(=O)(=O)(=O)[O-].Cl(=O)(=O)(=O)[O-] |
Title of publication | C44H36Cl4N16O16Zn2 |
Authors of publication | Matthews, Craig J.; Horton, Peter N.; Hursthouse, Michael B. |
Journal of publication | Crystal Structure Report Archive |
Year of publication | 2004 |
Pages of publication | 990 |
a | 17.648 ± 0.003 Å |
b | 12.6089 ± 0.0018 Å |
c | 22.985 ± 0.004 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 5114.7 ± 1.4 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 6 |
Space group number | 60 |
Hermann-Mauguin space group symbol | P b c n |
Hall space group symbol | -P 2n 2ab |
Residual factor for all reflections | 0.0552 |
Residual factor for significantly intense reflections | 0.0418 |
Weighted residual factors for significantly intense reflections | 0.095 |
Weighted residual factors for all reflections included in the refinement | 0.1018 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.068 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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