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Information card for entry 1519775
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| Coordinates | 1519775.cif |
|---|
| Formula | C32 H36 Cl2 P2 Pd2 S2 |
|---|---|
| Calculated formula | C32 H36 Cl2 P2 Pd2 S2 |
| SMILES | [Pd]12([S]([C@H](C[P]1(c1ccccc1)c1ccccc1)CC)[Pd]1(Cl)[S]2[C@H](C[P]1(c1ccccc1)c1ccccc1)CC)Cl.[Pd]12([S]([C@@H](C[P]1(c1ccccc1)c1ccccc1)CC)[Pd]1(Cl)[S]2[C@@H](C[P]1(c1ccccc1)c1ccccc1)CC)Cl |
| Title of publication | C32H36Cl2P2Pd2S2 |
| Authors of publication | Dervisi, Athanasia; Horton, Peter N.; Hursthouse, Michael B. |
| Journal of publication | Crystal Structure Report Archive |
| Year of publication | 2006 |
| Pages of publication | 1058 |
| a | 42.3472 ± 0.001 Å |
| b | 9.8258 ± 0.0003 Å |
| c | 17.1627 ± 0.0003 Å |
| α | 90° |
| β | 99.789 ± 0.001° |
| γ | 90° |
| Cell volume | 7037.3 ± 0.3 Å3 |
| Cell temperature | 120 ± 2 K |
| Ambient diffraction temperature | 120 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0533 |
| Residual factor for significantly intense reflections | 0.0378 |
| Weighted residual factors for significantly intense reflections | 0.0858 |
| Weighted residual factors for all reflections included in the refinement | 0.0913 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.043 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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