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Information card for entry 1519775
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Coordinates | 1519775.cif |
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Formula | C32 H36 Cl2 P2 Pd2 S2 |
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Calculated formula | C32 H36 Cl2 P2 Pd2 S2 |
SMILES | [Pd]12([S]([C@H](C[P]1(c1ccccc1)c1ccccc1)CC)[Pd]1(Cl)[S]2[C@H](C[P]1(c1ccccc1)c1ccccc1)CC)Cl.[Pd]12([S]([C@@H](C[P]1(c1ccccc1)c1ccccc1)CC)[Pd]1(Cl)[S]2[C@@H](C[P]1(c1ccccc1)c1ccccc1)CC)Cl |
Title of publication | C32H36Cl2P2Pd2S2 |
Authors of publication | Dervisi, Athanasia; Horton, Peter N.; Hursthouse, Michael B. |
Journal of publication | Crystal Structure Report Archive |
Year of publication | 2006 |
Pages of publication | 1058 |
a | 42.3472 ± 0.001 Å |
b | 9.8258 ± 0.0003 Å |
c | 17.1627 ± 0.0003 Å |
α | 90° |
β | 99.789 ± 0.001° |
γ | 90° |
Cell volume | 7037.3 ± 0.3 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 6 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0533 |
Residual factor for significantly intense reflections | 0.0378 |
Weighted residual factors for significantly intense reflections | 0.0858 |
Weighted residual factors for all reflections included in the refinement | 0.0913 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.043 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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