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Information card for entry 1519782
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Coordinates | 1519782.cif |
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Formula | C28 H32 Cd N2 O4 P2 S4 |
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Calculated formula | C28 H32 Cd N2 O4 P2 S4 |
SMILES | CCOP1(c2ccc(cc2)OC)=[S][Cd]2([n]3ccc(cc3)c3ccncc3)(S1)([S]=P(c1ccc(cc1)OC)(OCC)S2)[n]1ccc(c2cc[n](cc2)[Cd]23([S]=P(c4ccc(cc4)OC)(OCC)S2)[S]=P(c2ccc(cc2)OC)(OCC)S3)cc1 |
Title of publication | C28H32Cd1N2O4P2S4 |
Authors of publication | Devillanova, Francesco; Aragoni, Carla; Arca, Massimiliano; Hursthouse, Michael B.; Huth, Susanne L. |
Journal of publication | Crystal Structure Report Archive |
Year of publication | 2006 |
Pages of publication | 235 |
a | 8.18 ± 0.0002 Å |
b | 9.8839 ± 0.0002 Å |
c | 10.4172 ± 0.0002 Å |
α | 90.737 ± 0.001° |
β | 101.898 ± 0.001° |
γ | 100.785 ± 0.001° |
Cell volume | 808.42 ± 0.03 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0313 |
Residual factor for significantly intense reflections | 0.0298 |
Weighted residual factors for significantly intense reflections | 0.0748 |
Weighted residual factors for all reflections included in the refinement | 0.0759 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.042 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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