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Information card for entry 1520115
Preview
Coordinates | 1520115.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C42 H48 Ge3 Si2 |
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Calculated formula | C42 H48 Ge3 Si2 |
SMILES | [Ge]([Ge](c1ccccc1)(c1ccccc1)c1ccccc1)([Ge](c1ccccc1)(c1ccccc1)c1ccccc1)([Si](C)(C)C)[Si](C)(C)C |
Title of publication | Compounds of Group 14 Elements with an Element‒Element (E = Si, Ge, Sn) Bond: Effect of the Nature of the Element Atom |
Authors of publication | Zaitsev, Kirill V.; Lermontova, Elmira Kh.; Churakov, Andrei V.; Tafeenko, Viktor A.; Tarasevich, Boris N.; Poleshchuk, Oleg Kh.; Kharcheva, Anastasia V.; Magdesieva, Tatiana V.; Nikitin, Oleg M.; Zaitseva, Galina S.; Karlov, Sergey S. |
Journal of publication | Organometallics |
Year of publication | 2015 |
Journal volume | 34 |
Journal issue | 12 |
Pages of publication | 2765 |
a | 11.0225 ± 0.0003 Å |
b | 21.7372 ± 0.0006 Å |
c | 16.6855 ± 0.0005 Å |
α | 90° |
β | 92.4892 ± 0.0004° |
γ | 90° |
Cell volume | 3994 ± 0.2 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0371 |
Residual factor for significantly intense reflections | 0.0272 |
Weighted residual factors for significantly intense reflections | 0.0618 |
Weighted residual factors for all reflections included in the refinement | 0.065 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.028 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1520115.html
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Users of the data should acknowledge the original authors of the
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