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Information card for entry 1520276
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| Coordinates | 1520276.cif |
|---|---|
| External links | PubChem |
| Formula | C20 H29 N O2 S |
|---|---|
| Calculated formula | C20 H29 N O2 S |
| SMILES | S(=O)(=O)(N1[C@@H]([C@H](CC1)/C=C/C)C1CCCCC1)c1ccc(cc1)C.S(=O)(=O)(N1[C@H]([C@@H](CC1)/C=C/C)C1CCCCC1)c1ccc(cc1)C |
| Title of publication | C20H29NO2S |
| Authors of publication | Dobbs, Adrian; Stephenson, Richard; Hursthouse, Michael B. |
| Journal of publication | Crystal Structure Report Archive |
| Year of publication | 2008 |
| Pages of publication | 418 |
| a | 7.7257 ± 0.0002 Å |
| b | 21.1223 ± 0.0007 Å |
| c | 11.5315 ± 0.0002 Å |
| α | 90° |
| β | 96.654 ± 0.002° |
| γ | 90° |
| Cell volume | 1869.09 ± 0.09 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 120 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.095 |
| Residual factor for significantly intense reflections | 0.0678 |
| Weighted residual factors for significantly intense reflections | 0.1531 |
| Weighted residual factors for all reflections included in the refinement | 0.1737 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.965 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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