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Information card for entry 1534132
Preview
Coordinates | 1534132.cif |
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Original paper (by DOI) | HTML |
Formula | C96 H118 B2 O4 |
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Calculated formula | C96 H118 B2 O4 |
SMILES | B12c3c4c5ccccc5c5c3B3c6c(c7ccccc7c(c16)c1c6c2c2c(cc6c(cc1)OCCCCCCCCCCCC)c(ccc42)OCCCCCCCCCCCC)c1ccc(c2cc4c(c3c12)c5ccc4OCCCCCCCCCCCC)OCCCCCCCCCCCC |
Title of publication | Boron-doped nanographene: Lewis acidity, redox properties, and battery electrode performance |
Authors of publication | Osumi, Shinichiro; Saito, Shohei; Dou, Chuandong; Matsuo, Kyohei; Kume, Keita; Yoshikawa, Hirofumi; Awaga, Kunio; Yamaguchi, Shigehiro |
Journal of publication | Chem. Sci. |
Year of publication | 2016 |
Journal volume | 7 |
Journal issue | 1 |
Pages of publication | 219 |
a | 11.769 ± 0.012 Å |
b | 14.134 ± 0.013 Å |
c | 23.62 ± 0.02 Å |
α | 84.13 ± 0.03° |
β | 87.54 ± 0.02° |
γ | 84.78 ± 0.02° |
Cell volume | 3890 ± 6 Å3 |
Cell temperature | 98 ± 2 K |
Ambient diffraction temperature | 98 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1791 |
Residual factor for significantly intense reflections | 0.1016 |
Weighted residual factors for significantly intense reflections | 0.2431 |
Weighted residual factors for all reflections included in the refinement | 0.3144 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.064 |
Diffraction radiation wavelength | 0.7107 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1534132.html
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