Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 1540496
Preview
Coordinates | 1540496.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | 7Me-[7]CMP |
---|---|
Formula | C49 H42 |
Calculated formula | C49 H42 |
SMILES | c1c2cc(cc1c1cc(cc(c1)C)c1cc(cc(c1)C)c1cc(cc(c1)C)c1cc(cc(c1)C)c1cc(cc(c1)C)c1cc2cc(c1)C)C |
Title of publication | Aromatic hydrocarbon macrocycles for highly efficient organic light-emitting devices with single-layer architectures |
Authors of publication | Xue, Jing Yang; Izumi, Tomoo; Yoshii, Asami; Ikemoto, Koki; Koretsune, Takashi; Akashi, Ryosuke; Arita, Ryotaro; Taka, Hideo; Kita, Hiroshi; Sato, Sota; Isobe, Hiroyuki |
Journal of publication | Chem. Sci. |
Year of publication | 2016 |
Journal volume | 7 |
Journal issue | 2 |
Pages of publication | 896 |
a | 29.026 ± 0.006 Å |
b | 7.501 ± 0.0015 Å |
c | 33.242 ± 0.007 Å |
α | 90° |
β | 104.96 ± 0.03° |
γ | 90° |
Cell volume | 6992 ± 3 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 2 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0919 |
Residual factor for significantly intense reflections | 0.072 |
Weighted residual factors for significantly intense reflections | 0.1942 |
Weighted residual factors for all reflections included in the refinement | 0.2118 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.988 |
Diffraction radiation wavelength | 0.75 Å |
Diffraction radiation type | synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1540496.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.