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Information card for entry 1540530
Preview
Coordinates | 1540530.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C45 H62 N2 O2 P2 Rh2 S2 |
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Calculated formula | C45 H62 N2 O2 P2 Rh2 S2 |
SMILES | [Rh]1([P](Cc2nc(ccc2)c2ccccc2)(C(C)(C)C)C(C)(C)C)(C#[O])[S]2[Rh]([P](Cc3nc(ccc3)c3ccccc3)(C(C)(C)C)C(C)(C)C)(C#[O])[S]1CCC2 |
Title of publication | Reversible cyclometalation at RhIas a motif for metal‒ligand bifunctional bond activation and base-free formic acid dehydrogenation |
Authors of publication | Jongbloed, L. S.; de Bruin, B.; Reek, J. N. H.; Lutz, M.; van der Vlugt, J. I. |
Journal of publication | Catal. Sci. Technol. |
Year of publication | 2016 |
Journal volume | 6 |
Journal issue | 5 |
Pages of publication | 1320 |
a | 12.7487 ± 0.0004 Å |
b | 19.7725 ± 0.0006 Å |
c | 18.4361 ± 0.0005 Å |
α | 90° |
β | 103.046 ± 0.001° |
γ | 90° |
Cell volume | 4527.3 ± 0.2 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0396 |
Residual factor for significantly intense reflections | 0.0255 |
Weighted residual factors for significantly intense reflections | 0.0542 |
Weighted residual factors for all reflections included in the refinement | 0.058 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.023 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1540530.html
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