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Information card for entry 1540679
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Coordinates | 1540679.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | Silicalite-1 |
---|---|
Chemical name | Silicalite-1 |
Formula | O192 Si96 |
Calculated formula | O192 Si96 |
Title of publication | Capture of iodine and organic iodides using silica zeolites and the semiconductor behaviour of iodine in a silica zeolite |
Authors of publication | Pham, Tung Cao Thanh; Docao, Son; Hwang, In Chul; Song, Mee Kyung; Choi, Do Young; Moon, Dohyun; Oleynikov, Peter; Yoon, Kyung Byung |
Journal of publication | Energy Environ. Sci. |
Year of publication | 2016 |
Journal volume | 9 |
Journal issue | 3 |
Pages of publication | 1050 |
a | 13.347 ± 0.003 Å |
b | 20.082 ± 0.004 Å |
c | 19.827 ± 0.004 Å |
α | 90° |
β | 90.84 ± 0.03° |
γ | 90° |
Cell volume | 5313.7 ± 1.9 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 2 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.1273 |
Residual factor for significantly intense reflections | 0.1199 |
Weighted residual factors for significantly intense reflections | 0.3915 |
Weighted residual factors for all reflections included in the refinement | 0.3963 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.135 |
Diffraction radiation wavelength | 0.7 Å |
Diffraction radiation type | synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1540679.html
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