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Information card for entry 1543790
Preview
Coordinates | 1543790.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C56.5 H68.5 Cl2.5 F14 N7 O4 |
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Calculated formula | C56.5 H68.5 Cl2.5 F14 N7 O4 |
SMILES | [Cl-].ClC(Cl)Cl.Fc1ccc(cc1)[C@@]1(N(CCC1)C(=O)[C@@H](NC(=O)Nc1cc(cc(c1)C(F)(F)F)C(F)(F)F)C(C)(C)C)C.Fc1ccc(cc1)[C@@]1(N(CCC1)C(=O)[C@@H](NC(=O)Nc1cc(cc(c1)C(F)(F)F)C(F)(F)F)C(C)(C)C)C.[N+](C)(C)(C)C |
Title of publication | Conformational Control of Chiral Amido-Thiourea Catalysts Enables Improved Activity and Enantioselectivity. |
Authors of publication | Lehnherr, Dan; Ford, David D.; Bendelsmith, Andrew J.; Kennedy, C. Rose; Jacobsen, Eric N. |
Journal of publication | Organic letters |
Year of publication | 2016 |
Journal volume | 18 |
Journal issue | 13 |
Pages of publication | 3214 - 3217 |
a | 14.092 ± 0.002 Å |
b | 18.525 ± 0.003 Å |
c | 46.955 ± 0.007 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 12258 ± 3 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.0461 |
Residual factor for significantly intense reflections | 0.042 |
Weighted residual factors for significantly intense reflections | 0.1121 |
Weighted residual factors for all reflections included in the refinement | 0.1157 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.027 |
Diffraction radiation wavelength | 1.54178 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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The link is: https://www.crystallography.net/1543790.html
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Users of the data should acknowledge the original authors of the
structural data.