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Information card for entry 1544232
Preview
Coordinates | 1544232.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C25 H20 F3 N3 O4 S2 |
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Calculated formula | C25 H20 F3 N3 O4 S2 |
SMILES | S(=O)(=O)(N1C[C@@]2(SC\1=N/c1ccccc1)[C@@H](C(F)(F)F)CCc1c2cccc1)c1ccc(N(=O)=O)cc1.S(=O)(=O)(N1C[C@]2(SC\1=N/c1ccccc1)[C@H](C(F)(F)F)CCc1c2cccc1)c1ccc(N(=O)=O)cc1 |
Title of publication | The dual role of thiourea in the thiotrifluoromethylation of alkenes. |
Authors of publication | Ricci, Paolo; Khotavivattana, Tanatorn; Pfeifer, Lukas; Médebielle, Maurice; Morphy, John Richard; Gouverneur, Véronique |
Journal of publication | Chemical science |
Year of publication | 2017 |
Journal volume | 8 |
Journal issue | 2 |
Pages of publication | 1195 - 1199 |
a | 6.848 ± 0.0001 Å |
b | 20.4301 ± 0.0003 Å |
c | 17.057 ± 0.0002 Å |
α | 90° |
β | 90.304 ± 0.0011° |
γ | 90° |
Cell volume | 2386.33 ± 0.06 Å3 |
Cell temperature | 150 K |
Ambient diffraction temperature | 150 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0326 |
Residual factor for significantly intense reflections | 0.0313 |
Weighted residual factors for all reflections | 0.0824 |
Weighted residual factors for significantly intense reflections | 0.0812 |
Weighted residual factors for all reflections included in the refinement | 0.0824 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.9995 |
Diffraction radiation wavelength | 1.5418 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1544232.html
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Users of the data should acknowledge the original authors of the
structural data.