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Information card for entry 1544283
Preview
Coordinates | 1544283.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C31 H23.5 Cl2 F6 N5.5 O P Ru |
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Calculated formula | C31 H23.5 Cl2 F6 N5.5 O P Ru |
SMILES | [Ru]12(Cl)(Cl)(N=O)[n]3ccccc3c3[n]1c(cc(c3)c1cc3Cc4ccccc4c3cc1)c1[n]2cccc1.[P](F)(F)(F)(F)(F)[F-].N#CC.N#CC |
Title of publication | trans- and cis-(Cl,Cl)-[Ru(II)(FT)Cl2(NO)](PF6): promising candidates for NO release in the NIR region. |
Authors of publication | Akl, Joelle; Sasaki, Isabelle; Lacroix, Pascal G.; Hugues, Vincent; Vicendo, Patricia; Bocé, Mathilde; Mallet-Ladeira, Sonia; Blanchard-Desce, Mireille; Malfant, Isabelle |
Journal of publication | Photochemical & photobiological sciences : Official journal of the European Photochemistry Association and the European Society for Photobiology |
Year of publication | 2016 |
Journal volume | 15 |
Journal issue | 12 |
Pages of publication | 1484 - 1491 |
a | 7.2084 ± 0.0006 Å |
b | 11.366 ± 0.0009 Å |
c | 20.0517 ± 0.0016 Å |
α | 74.296 ± 0.003° |
β | 80.187 ± 0.003° |
γ | 87.543 ± 0.003° |
Cell volume | 1558.4 ± 0.2 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 8 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0509 |
Residual factor for significantly intense reflections | 0.0373 |
Weighted residual factors for significantly intense reflections | 0.0874 |
Weighted residual factors for all reflections included in the refinement | 0.0944 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.057 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1544283.html
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Users of the data should acknowledge the original authors of the
structural data.