Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 1544752
Preview
Coordinates | 1544752.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | Compound 6 |
---|---|
Chemical name | {[SiP(iPr)2P(NMe)]FeN2}{Na(THF)2} |
Formula | C43 H65 Fe N3 Na O2 P3 Si |
Calculated formula | C43 H65 Fe N3 Na O2 P3 Si |
SMILES | CC([P]1(c2c([Si]34c5c([P]6(CCN(CC6)C)[Fe]14([P](c1c3cccc1)(C(C)C)C(C)C)[N]#[N][Na]([O]1CCCC1)[O]1CCCC1)cccc5)cccc2)C(C)C)C |
Title of publication | Exploring secondary-sphere interactions in Fe-N x H y complexes relevant to N2 fixation. |
Authors of publication | Creutz, Sidney E.; Peters, Jonas C. |
Journal of publication | Chemical science |
Year of publication | 2017 |
Journal volume | 8 |
Journal issue | 3 |
Pages of publication | 2321 - 2328 |
a | 13.454 ± 0.005 Å |
b | 10.208 ± 0.004 Å |
c | 32.264 ± 0.014 Å |
α | 90° |
β | 90.86 ± 0.008° |
γ | 90° |
Cell volume | 4431 ± 3 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 8 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.1237 |
Residual factor for significantly intense reflections | 0.086 |
Weighted residual factors for significantly intense reflections | 0.1956 |
Weighted residual factors for all reflections included in the refinement | 0.2116 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.055 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1544752.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.