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Information card for entry 1544982
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Coordinates | 1544982.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | Ga[OSi(OtBu)3]3(thf) |
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Formula | C40 H89 Ga O13 Si3 |
Calculated formula | C40 H89 Ga O13 Si3 |
SMILES | [Ga]([O]1CCCC1)(O[Si](OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C)(O[Si](OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C)O[Si](OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C |
Title of publication | Silica-supported isolated gallium sites as highly active, selective and stable propane dehydrogenation catalysts |
Authors of publication | Searles, Keith; Siddiqi, Georges; Safonova, Olga V.; Copéret, Christophe |
Journal of publication | Chem. Sci. |
Year of publication | 2017 |
Journal volume | 8 |
Journal issue | 4 |
Pages of publication | 2661 |
a | 18.0886 ± 0.0005 Å |
b | 25.2724 ± 0.001 Å |
c | 26.1157 ± 0.001 Å |
α | 62.983 ± 0.004° |
β | 89.953 ± 0.003° |
γ | 89.655 ± 0.003° |
Cell volume | 10635.5 ± 0.8 Å3 |
Cell temperature | 100 ± 1.7 K |
Ambient diffraction temperature | 100 ± 1.7 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1188 |
Residual factor for significantly intense reflections | 0.0741 |
Weighted residual factors for significantly intense reflections | 0.1174 |
Weighted residual factors for all reflections included in the refinement | 0.1374 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.02 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1544982.html
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