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Information card for entry 1545027
Preview
Coordinates | 1545027.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | 4,5-bis(thiophene-2-yl)thieno[3,2-e]benzo[b]thiophene |
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Formula | C18 H10 S4 |
Calculated formula | C18 H10 S4 |
SMILES | s1c2c(c(c3sccc3c2cc1)c1sccc1)c1sccc1 |
Title of publication | Aggregation-induced emission: mechanistic study of the clusteroluminescence of tetrathienylethene |
Authors of publication | Viglianti, Lucia; Leung, Nelson L. C.; Xie, Ni; Gu, Xinggui; Sung, Herman H. Y.; Miao, Qian; Williams, Ian D.; Licandro, Emanuela; Tang, Ben Zhong |
Journal of publication | Chem. Sci. |
Year of publication | 2017 |
Journal volume | 8 |
Journal issue | 4 |
Pages of publication | 2629 |
a | 10.91901 ± 0.00014 Å |
b | 8.76755 ± 0.00011 Å |
c | 15.8755 ± 0.0002 Å |
α | 90° |
β | 93.1272 ± 0.0011° |
γ | 90° |
Cell volume | 1517.55 ± 0.03 Å3 |
Cell temperature | 100.1 ± 0.5 K |
Ambient diffraction temperature | 100.1 ± 0.5 K |
Number of distinct elements | 3 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0274 |
Residual factor for significantly intense reflections | 0.0261 |
Weighted residual factors for significantly intense reflections | 0.0652 |
Weighted residual factors for all reflections included in the refinement | 0.0661 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.002 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1545027.html
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Users of the data should acknowledge the original authors of the
structural data.