Information card for entry 1545027
| Chemical name |
4,5-bis(thiophene-2-yl)thieno[3,2-e]benzo[b]thiophene |
| Formula |
C18 H10 S4 |
| Calculated formula |
C18 H10 S4 |
| SMILES |
s1c2c(c(c3sccc3c2cc1)c1sccc1)c1sccc1 |
| Title of publication |
Aggregation-induced emission: mechanistic study of the clusteroluminescence of tetrathienylethene |
| Authors of publication |
Viglianti, Lucia; Leung, Nelson L. C.; Xie, Ni; Gu, Xinggui; Sung, Herman H. Y.; Miao, Qian; Williams, Ian D.; Licandro, Emanuela; Tang, Ben Zhong |
| Journal of publication |
Chem. Sci. |
| Year of publication |
2017 |
| Journal volume |
8 |
| Journal issue |
4 |
| Pages of publication |
2629 |
| a |
10.91901 ± 0.00014 Å |
| b |
8.76755 ± 0.00011 Å |
| c |
15.8755 ± 0.0002 Å |
| α |
90° |
| β |
93.1272 ± 0.0011° |
| γ |
90° |
| Cell volume |
1517.55 ± 0.03 Å3 |
| Cell temperature |
100.1 ± 0.5 K |
| Ambient diffraction temperature |
100.1 ± 0.5 K |
| Number of distinct elements |
3 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.0274 |
| Residual factor for significantly intense reflections |
0.0261 |
| Weighted residual factors for significantly intense reflections |
0.0652 |
| Weighted residual factors for all reflections included in the refinement |
0.0661 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.002 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
1.54184 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
Yes |
| Has Fobs |
No |
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https://www.crystallography.net/1545027.html