Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 1545517
Preview
Coordinates | 1545517.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C66 H62 N7 O7 S |
---|---|
Calculated formula | C66 H62 N7 O7 S |
SMILES | S(CC(=O)NCC(c1ccccc1)c1ccccc1)CC(=O)NCC(c1ccccc1)c1ccccc1.O=C1NCc2ccc(CNC(=O)c3cc(C(=O)NCc4ccc(CNC(=O)c5cc1ccc5)cc4)ccc3)cc2.O.N#CC |
Title of publication | Photoswitchable interlocked thiodiglycolamide as a cocatalyst of a chalcogeno-Baylis‒Hillman reaction |
Authors of publication | Martinez-Cuezva, Alberto; Saura-Sanmartin, Adrian; Nicolas-Garcia, Tomas; Navarro, Cristian; Orenes, Raul-Angel; Alajarin, Mateo; Berna, Jose |
Journal of publication | Chem. Sci. |
Year of publication | 2017 |
Journal volume | 8 |
Journal issue | 5 |
Pages of publication | 3775 |
a | 10.2417 ± 0.0008 Å |
b | 17.4702 ± 0.0014 Å |
c | 18.1698 ± 0.0015 Å |
α | 117.24 ± 0.003° |
β | 90.58 ± 0.003° |
γ | 92.649 ± 0.003° |
Cell volume | 2885.6 ± 0.4 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0497 |
Residual factor for significantly intense reflections | 0.0446 |
Weighted residual factors for significantly intense reflections | 0.1443 |
Weighted residual factors for all reflections included in the refinement | 0.1477 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.175 |
Diffraction radiation wavelength | 1.54178 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1545517.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.