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Information card for entry 1545532
Preview
| Coordinates | 1545532.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C70 H99 N5 Na2 O11 P6 |
|---|---|
| Calculated formula | C70 H99 N5 Na2 O11 P6 |
| SMILES | C(OCC)C.C1OCCC1.[Na+].[N]#CC.[O-]c1oc(P2N(C(=O)C(=O)N2c2c(cccc2C(C)C)C(C)C)c2c(cccc2C(C)C)C(C)C)pp1 |
| Title of publication | (Phosphanyl)phosphaketenes as building blocks for novel phosphorus heterocycles |
| Authors of publication | Hansmann, Max M.; Ruiz, David A.; Liu, Liu (Leo); Jazzar, Rodolphe; Bertrand, Guy |
| Journal of publication | Chem. Sci. |
| Year of publication | 2017 |
| Journal volume | 8 |
| Journal issue | 5 |
| Pages of publication | 3720 |
| a | 27.6426 ± 0.0013 Å |
| b | 11.7291 ± 0.0006 Å |
| c | 24.5253 ± 0.0012 Å |
| α | 90° |
| β | 103.246 ± 0.002° |
| γ | 90° |
| Cell volume | 7740.1 ± 0.7 Å3 |
| Cell temperature | 100 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0409 |
| Residual factor for significantly intense reflections | 0.0355 |
| Weighted residual factors for significantly intense reflections | 0.0924 |
| Weighted residual factors for all reflections included in the refinement | 0.0961 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.029 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Diffraction radiation X-ray symbol | K-L~3~ |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1545532.html
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Users of the data should acknowledge the original authors of the
structural data.