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Information card for entry 1546175
Preview
Coordinates | 1546175.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C30 H51 Al Si3 Ti2 |
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Calculated formula | C30 H51 Al Si3 Ti2 |
SMILES | C([AlH]1[H][Ti]23456789([cH]%10[cH]5[cH]4[cH]3[cH]2%10)([cH]2[cH]6[cH]7[cH]8[cH]92)[H][Ti]23456789([cH]%10[cH]2[cH]3[cH]4[cH]5%10)([cH]2[cH]6[cH]7[cH]8[cH]92)[H]1)([Si](C)(C)C)([Si](C)(C)C)[Si](C)(C)C |
Title of publication | Hydride oxidation from a titanium‒aluminum bimetallic complex: insertion, thermal and electrochemical reactivity |
Authors of publication | Brown, Alexandra C.; Altman, Alison B.; Lohrey, Trevor D.; Hohloch, Stephan; Arnold, John |
Journal of publication | Chem. Sci. |
Year of publication | 2017 |
a | 11.8167 ± 0.0011 Å |
b | 16.7464 ± 0.0016 Å |
c | 18.0477 ± 0.0018 Å |
α | 105.953 ± 0.004° |
β | 103.15 ± 0.004° |
γ | 90.965 ± 0.004° |
Cell volume | 3331.8 ± 0.6 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1062 |
Residual factor for significantly intense reflections | 0.0933 |
Weighted residual factors for significantly intense reflections | 0.2365 |
Weighted residual factors for all reflections included in the refinement | 0.247 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.052 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1546175.html
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